M2
For optical measuring systems designed to combine measurements, feature constructions, tolerance evaluation, and reporting in one integrated software solution.
Intuitive Software for Optical Measuring Systems
M2 – Our metrology software for measuring microscopes, optical comparators, and similar optical measuring systems. Its icon-based user interface is designed for simple, intuitive operation and supports touchscreen, mouse, and keyboard control.
Optical Edge Detection or Crosshair Measurements
Measurement points can be captured using optical edge detection or crosshairs. Feature detail views provide key information about measured features, including position, size, form, and point distribution. On systems equipped with Optical Edge, additional functions such as EdgeLogic™ make it possible to start and complete measurements quickly without directly interacting with the software.
Constructions Directly in the Part View
Common constructions such as distances, intersections, midpoints, bolt circles, and tangent lines can be created directly in the graphical part view. This allows measurements and results to be managed clearly within a single view.
Geometric Tolerancing and Evaluation
Nominal values and tolerances can be applied to measured and constructed features. Deviations and inspection results are displayed clearly for quick evaluation.
Part Programs, Playback and Reports
Recurring measurement routines can be saved as part programs and played back as needed. Measurement results can be viewed, printed, or exported in a variety of report formats.
Comprehensive Documentation and Analysis
M2 supports part view markup and annotation, a runs database with statistics, flexible report templates, user message steps with variables, and formula evaluation for both simple and complex calculations.
Applications
- Measuring microscopes
- Optical comparators
- Optical measuring systems with crosshairs or optical edge detection
- Recurring inspection routines
- Geometric measurement, tolerance evaluation, and reporting
Optical Edge
Measurement point acquisition using optical edge detection on compatible optical measuring systems equipped with the required interface and sensor hardware.
Profiling
Comparison of measurement data against DXF contours, including best-fit analysis, tolerance visualization, and a graphical display of profile deviations—particularly for optical comparator applications.
| Operating System | Windows® |
|---|---|
| Controls | Touchscreen, mouse, keyboard |
| Calibration | Supports common calibration methods, including LEC, SLEC, NLEC, and squareness correction |
| Hardware |
The M2 software is used with compatible interface hardware. Depending on the measuring system, different options are available for connecting encoders and other system hardware.
→ View Interface Hardware |
Questions?
Have questions about M2 metrology software, need additional information, or want to request a demo? Our team will be happy to help.